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Author (up) Tollenaar, N.; Mooijaart, A. url  openurl
  Title Type I errors and power of the parametric bootstrap goodness-of-fit test: Full and limited information Type Journal Article
  Year 2003 Publication British Journal of Mathematical and Statistical Psychology Abbreviated Journal  
  Volume 56 Issue 2 Pages 271-288  
  Keywords Type I errors; goodness-of-fit test; parametric bootstrap; sparseness; information statistics; Markov models; Goodness of Fit; Markov Chains; Parametric Statistical Tests; Statistical Data  
  Abstract In sparse tables for categorical data well-known goodness-of-fit statistics are not chi-square distributed. A consequence is that model selection becomes a problem. It has been suggested that a way out of this problem is the use of the parametric bootstrap. In this paper, the parametric bootstrap goodness-of-fit test is studied by means of an extensive simulation study; the Type I error rates and power of this test are studied under several conditions of sparseness. In the presence of sparseness, models were used that were likely to violate the regularity conditions. Besides bootstrapping the goodness-of-fit usually used (full information statistics), corrected versions of these statistics and a limited information statistic are bootstrapped. These bootstrap tests were also compared to an asymptotic test using limited information. Results indicate that bootstrapping the usual statistics fails because these tests are too liberal, and that bootstrapping or asymptotically testing the limited information statistic works better with respect to Type I error and outperforms the other statistics by far in terms of statistical power. The properties of all tests are illustrated using categorical Markov models. (PsycINFO Database Record (c) 2006 APA, all rights reserved) (from the journal abstract)  
  Corporate Author Thesis  
  Publisher British Psychological Society Place of Publication Tollenaar, Nikolaj, Wetenschapftelijk Onderzoek-en Dowmentatiecentrum, PO Box 20301, Koninginnegrach Editor  
  Language Summary Language Original Title  
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  ISSN ISBN Medium  
  Area Expedition Conference  
  Notes 0007-1102Accession Number: 2003-09687-005. First Author & Affiliation: Tollenaar, Nikolaj; Department of Psychology, Leiden University, Leiden, Netherlands. Release Date: 20031222. Publication Type: Journal; Peer Reviewed Journal. Media Covered: Electronic. Media Available: Electronic; Print. Document Type: Original Journal Article. Language: English. Major Descriptor(s): Goodness of Fit; Markov Chains; Parametric Statistical Tests; Statistical Data; Type I Errors. Classification: Statistics & Mathematics (2240). References Available: Y. Approved no  
  Call Number refbase @ user @ Tollenaar2003 Serial 4596  
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